ETS'18 | CALLS

Download the Call for Papers in PDF version here.

You are invited to participate and submit your contributions to ETS'18. The following topic chairs have been selected to put particular emphasis on their topic:
P. Bernardi: Microprocessor and On-line Test, K. Chakrabarty: Emerging Technologies in Test, P. Girard: Power Issues in Test, S. Hamdioui: Memory and Nanotechnology Test, E. Larsson: Test Architectures and Standards, G. Léger: Analog/Mixed Signal Test , M. Maniatakos: Security and Trust Issues in Test, I. Polian: Test Generation and Reliability, J. Rivoir: Automatic Test Equipment and Yield, C. Scholl: Validation and Verification, A. Singh: Defect-based Test and Variability.

The areas of interest include (but are not limited to) the following topics:

Analog Test
ATE Hardware and Software
Automatic Test Generation
Board Test and Diagnosis
Boundary Scan Test
Built-In Self-Test (BIST)
Current-Based Test
Defect-Based Test
Delay and Performance Test
Dependability and Functional Safety
Design for Test (DfT)
Design for Manufacturing (DfM)
Diagnosis and Silicon Debug
Economics of Test
Test of Emerging Technologies
Failure Analysis
Fault Injection
Fault Modeling and Simulation

Fault Tolerance
GPU Test
Hardware Trojans
Hardware and IP Security Test and Verification
High-Speed I/O Test
Low-Power IC Test
Memory Test and Repair
MEMS Test
Microprocessor Test
Mixed-Signal Test
Multi-/Many-core Processor Test
Nanotechnology Test
On-line Test
Power Issues in Test
Reconfigurable System Test
Reliability
Reliability-Security Trade-offs

RF Test
Security and Trust Issues in Test
Self-Repair
Sensor Test
Side-channels Analysis
Signal Integrity Test
SiP, Stacked, 3D IC Test
SoC Test
Soft Errors
Standards in Test
Statistical Learning in Test
Test Compression
Test Quality
Test Synthesis
Thermal Issues in Test
Validation and Verification
Variability Issues in Test
Yield Analysis and Enhancement

Guidelines for Authors

Prospective authors are invited to submit novel, unpublished, and complete research contributions. Each submitted scientific paper should be a complete PDF manuscript, up to six (6) pages (inclusive of all figures, tables, and bibliography) in a standard IEEE format. The IEEE template can be found here. Papers not compliant with the IEEE template or exceeding the page limit will be returned without review.

A submitted scientific paper can be accepted for oral presentation or for poster presentation.

ETS fully complies with the IEEE publication policies regarding double submissions, plagiarism, etc. Authors unfamiliar with the IEEE official rules regarding double submissions and IEEE ethics are advised to read the Publication Guidelines section of the IEEE PSPB Operations Manual that can be found here.

A submission of a scientific paper is considered a commitment that, upon acceptance, authors will submit their camera-ready version for inclusion in the formal Proceedings and will present the paper (or the poster) at the symposium. Each accepted contribution must have at least one full paid registration by the time the camera ready paper is submitted for inclusion in the proceedings. ETS reserves the right to remove from IEEE Xplore papers and posters not presented at the symposium.

Camera-ready Submissions

Important information about the Camera-ready Submissions can be found here.

Key Dates

Paper Submission Deadline: ~~December 4, 2017~~ December 12, 2017
Notification of acceptance: February 13, 2018
Camera-ready manuscript: March 18, 2018

Submission Website

Submissions should be made electronically as a single PDF file here.

Publications

ETS'18 will produce electronic formal Proceedings including all scientific papers, with ISBN number to be indexed in the IEEE Xplore Digital Library and other bibliographical search engines.

Scientific papers accepted for oral presentation require a final 6-page manuscript for inclusion in the formal Proceedings while scientific papers accepted for poster presentation require a final 2-page manuscript for inclusion in the formal Proceedings.